Jens Dickel, Synopsys

Name: Jens Dickel
Designation: Applications Consultant
Title: The Technology of Debug:  Turning Art into a Science

Abstract : When users are asked to list their verification challenges, debug consistently appears at or near the top of the list. Even as verification has moved from directed tests towards a methodical “science”, debug has remained an “art”. Furthermore, many debug “artists” have to work in multiple media, making it harder for their talents to be productively re-used. When we add on the additional complexity of debugging designs in the presence of the embedded software, then debug can easily become non-deterministic and open-ended.

To address these debug challenges, Synopsys is taking a lead in providing productive debug environments, applicable in verification flows based on all simulators, all languages and all methodologies. Synopsys’ debug solution, built on top of the Verdi3 advanced debug platform, solves the most complicated SoC debug problems, all the way from RTL to gate-level design.

This presentation will overview some of the technologies underpinning Verdi3’s success, including Siloti, for debug visibility optimization, Verdi3 Power-Aware Debug for low power debug and ProtoLink for prototype debug.

We will also introduce Verdi3 HW-SW Debug, for instruction-accurate embedded processor debug, raising productivity in this critical area.

 Biography : Jens Dickel is Field Applications Consultant for Synopsys in the Central European region, having joined as part of the Springsoft Acquisition in 2012. He has more than 15 years of experience in the EDA and semiconductor industry, specializing in the verification and debug of IPs and System-On-Chips. Currently, his focus is to help Synopsys customers maximize their productivity using VCS, Verdi, Siloti and Certitude.

Previously, Jens spent 5 years at Philips Semiconductors where he gained expertise in the design and verification of complex Multimedia SOCs for consumer products.

Jens received his Master of Science degree in Data Processing from the University of Siegen, Germany.

Slides and Presentation will follow shortly