DVClub – Measuring the Effectiveness of Verification Environments

Join us for DVClub on Monday 28th April, where Yogish Sekhar from Dialog Semiconductors, will be discussing Measuring the Effectiveness of Verification Environments.  During the presentation he will be talking about shrinking transistor sizes which mean more complex design is squeezed into the same area that was used a product generation earlier.  The world is aware of Moore’s law for design; but it is more applicable to the verification space today as verification complexity has increased exponentially.  There are multitudes of tools (i.e. simulators, methodologies) that tell us how we need to verify our designs and various different metrics that tell us what we have verified.  To listen to Yogish and the other speakers, register to attend at Bristol, Cambridge, Eindhoven, Grenoble, Sophia or by Remote Access if you are unable to attend in person.

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