Tag Archives: IC Design

A Simple Way to Improve Automotive In-System Test

The remarkable growth in automotive IC design has prompted a focus on ISO26262 functional safety compliance, which includes both high-quality manufacturing test and a minimum stuck-at test coverage of 90% for in-system test. This article explores what is hybrid ATPG/LBIST, how do hybrid ATPG/LBIST test points work and describes the way to improve automotive in-system test.

Read More


Explore how T&VS effectively deliver end-to-end DFT support from design all the way to silicon.