High Performance, Low Power, And Test: DFT’s Impact on System PPA And Safety

As test grows in importance, earlier integration is key. Safety-critical semiconductor applications have driven test squarely into the functional specification and system architecture stages of design. Without the proper consideration of test, high levels of coverage in short test times is impractical.

A poorly integrated test strategy results in negative impacts to system performance, power consumption, and in obtaining safety certification for the final product. This article highlights the impact of DFT on system power, performance, and area(PPA) and safety.

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