Memory BIST for automotive designs

Built-in self-test (BIST) is the standard approach to test embedded memories. Over the years, memory BIST has evolved to meet the demands of new markets and technologies. Its capabilities respond to the requirements of ICs for the fast-growing automotive electronics market. This article from Tech Design Forum outlines how memory BIST capabilities must be enhanced to support automotive designs.

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Learn more about T&VS Automotive Verification and Test  Solutions

2016-01-12T07:16:23+00:0012th January, 2016|Blog, Thought Leadership|