BIST (Built-in self-test) is a feature provided in integrated circuits which allows testing its own operation without need of any external hardware. With the increased complexity of modern day SoCs, the number of memory blocks and LBIST partitions is increasing, which is in turn making verification efforts quite challenging. This article from Design Reuse highlights the key decisions to be made while deciding the verification strategy for self-tests, and what are the road-blocks in executing the verification plan.

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