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Validating on-chip variation: Is your library’s LVF data correct?

Variation modeling for 20/22nm and smaller process technologies requires a high degree of accuracy due to the significant impact of OCV effects at these process nodes. Library teams have standardized on using the Liberty Variation Format (LVF) to specify OCV information for these process nodes. This article explains how to verify LVF data are correct for validating on-chip variation.

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22nd May, 2019|Blog, Thought Leadership|